On the Capability of Measuring Actual Strain Values With Electrical Impedance Tomography Using Planar Silkscreen Printed Elastoresistive Sensors
نویسندگان
چکیده
A commonly used parameter in Structural Health Monitoring (SHM) to ensure the reliability and structural integrity of a lightweight structure is mechanical strain. Usually, strain gauge standard solution measure local The aim this paper through two-dimensional Electrical Impedance Tomography (2D EIT) combination with planar elastoresistive sensor. Thereby, quantitative value conductivity change as function reconstructed. advantage method compared conventional that EIT allows simultaneous spatial damage monitoring by single In presented test setup, sensor bent uniformly over surface calculated results are verified using Montgomery method. article presents main steps for measurement 2D EIT, starting an appropriate derivation Finite Element (FE) model well data processing. Furthermore, selection hyperparameter, which controls reconstruction algorithm, presented. suitable hyperparameter essential actual values. approach based on combinational use L-Curve (LC) fixed Noise Figure (NF)
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ژورنال
عنوان ژورنال: IEEE Sensors Journal
سال: 2021
ISSN: ['1558-1748', '1530-437X']
DOI: https://doi.org/10.1109/jsen.2020.3036736